Four Essential Oscilloscope Network Security Practices

 Currently manufactured Teledyne LeCroy oscilloscopes utilize either the 64-bit Microsoft® Windows® 10 Professional or 32-bit Microsoft CE platforms to support the oscilloscope application. From a networking perspective, they are for all intents and purposes Personal Computers (PCs).

Using a commonly available computer operating system such as Microsoft Windows on a Teledyne LeCroy oscilloscope offers a multitude of advantages, such as the ability to link third-party software to oscilloscope operations and to connect to a wide variety of hardware. The downside of using a common operating system is the threat of malware. 

Malware (including but not limited to viruses, Trojan horses, worms, bots, keyloggers and spyware) can infect a PC via many paths. Examples include websites, USB memory sticks, emails and your local area network. Simply connecting an unprotected PC (i.e., unprotected Windows-based oscilloscope) to a “compromised” network is enough to infect the PC within seconds. Likewise, a compromised oscilloscope can infect an entire network.

Below, we list four practices Teledyne LeCroy strongly encourages all users to follow to minimize the risks that malware presents. Remember, the time you spend attending to oscilloscope network security is minimal compared to the cost of having to clean up an infected instrument. . .or network!

Setting Up Your Oscilloscope for EFT Testing

Figure 1: The typical EFT test signal consists of
multiple exponential pulses arranged as pulse bursts.

A third type of electromagnetic compatibility (EMC) testing deals with how devices respond to electrical fast transients (EFT). EFTs are a series of fast, high frequency pulses, often occurring in bursts. These transient events are the result of electrical arcing. EFT pulse bursts occur when a power connection is made or broken, equipment is powered down or circuit breakers are switched. They also occur when inductive loads such as relays, switch contactors or heavy-duty motors produce bursts of narrow high-frequency transients on the power distribution system when de-energized.

The typical compound waveform used for EFT testing is shown in Figure 1.

Figure 2: Acquisition of two EFT bursts at
1.25 GS/s, zoomed to show several timing epochs.

The pulse waveform for EFT testing is defined by a risetime of 5 ns and a pulse width of 50 ns. These pulses are combined into bursts of 5 to 50 pulses spaced at from 10 to 100 µs (10 to 100 kHz). The bursts are typically spaced as much as 300 ms apart. Figure 2 shows an EFT test signal, with two EFT bursts captured by an oscilloscope on channel 2 sampled at 1.25 GS/s.

The two EFT pulse burst are shown in the upper left-hand trace (the two pink blocks). A series of zoom-on-zoom traces are opened to show several timing epochs. Trace Z2 (second from top left) shows a single burst. The zooms keep expanding the horizontal scale until finally at Z8 (bottom right) we see a single EFT pulse.

Following are six, important things to do to make sure you get the best EFT test measurements from your oscilloscope.

Setting Up Your Oscilloscope for Surge Testing

Figure 1: A typical EMC surge test waveform with
1.2 µs rise time and 50 µs half amplitude time.
Zoom trace Z1 shows the details of the rise time.
Click any image to expand it.

Electrical surges result from phenomena like lightning strikes and switching transients.  Electronic devices are subjected to simulated surges to confirm that they continue to operate properly following a surge, just as they are tested against electrostatic discharge. 

Surge pulses are similar to ESD pulses in that they have a very fast rise time, but the fall time is much, much slower. Figure 1 shows a typical surge pulse waveform. Surge testing involves similar measurements to those made for  ESD pulse testing—such as rise time, pulse width and max—but surge testing also requires some additional measurements, such as area under the pulse curve and transmitted charge. 

Figure 2: To verify the surge generator waveform, the
oscilloscope is connected to the generator through an attenuator.

As with ESD pulse tests, oscilloscopes are primarily used to “test the tester,” confirming the output of the surge generator. So, before a surge generator is hooked up to the device under test, it's required to hook it up to an oscilloscope and conduct a series of measurements to make sure the surge pulse is within specification. Figure 2 shows a typical surge test setup.

Following are three, important things to do to make sure you get the best surge measurements from your oscilloscope.

Setting Up Your Oscilloscope for ESD Pulse Testing

Figure 1: An ESD calibration test setup. 
The ESD gun discharges its waveform
into a properly attenuated current target. 

Electrostatic discharge (ESD) pulse tests are a type of conducted immunity testing done to confirm that a device can withstand a sudden transient electrostatic discharge. It is done by using an ESD gun to shoot a pulse of the required voltage at a device while testing that the DUT continues to operate properly. The ESD pulse shape simulates a person, carrying a static charge, touching a device. When their fingertip first touches the device, there is a leading edge with a high peak and fast decay, often visible in the real world as a spark flying from the fingertip. This is followed by a second edge due to the charge in the rest of the human body that propagates toward the fingertip with a time delay.

Oscilloscopes are most often used to “test the tester” in ESD pulse test setups, confirming that the pulse from the ESD gun is the right shape and meets the requirements of the standard to which the device is being tested. A typical calibration test setup is shown in Figure 1. The pulse from the ESD gun is fired directly into a current shunt target connected to the oscilloscope through an attenuator required to keep the signal within the limits of the oscilloscope’s 50 Ω input, which is used for this testing. Then, key parameters of the ESD pulse are measured per one of several standards, such as IEC 61000-4-2.  

ESD standards require a range of measurements. The most common are the initial edge 10% to 90% rise time, peak amplitude, pulse width, amplitude and current levels at specified times from the initial edge (e.g., T1 and T2), and time to half value. 

Following are four, important things to do to make sure you get the best ESD pulse measurements from your oscilloscope.

PCI Express 4.0 Error Detection Using a BERT and Oscilloscope

Figure 1: BERT and Oscilloscope connection
for PCI Express 4.0 error detection.

The PCI Express® 4.0 standard specification requires an oscilloscope with at least 25 GHz analog bandwidth and a BERT which can test bit rates of at least 16 Gbps. The BERT provides a known input pattern to the PCIe® device under test (DUT), and the DUT is instructed to regenerate the identical bit pattern while placed in loopback mode. Since a BERT can output a signal when a bit error is detected, this signal can be input to the oscilloscope to trigger a synchronized capture when an error occurs. By combining the capabilities of these two instruments, a powerful combination of real-time error detection and characterization can emerge.

Connecting the Instruments

In Figure 1, a known pattern is connected from the BERT PPG D1 output to the PCIe DUT input via a 2.92 mm K-type cable. The DUT attempts to regenerate the same data pattern, while the DUT output is routed to both the BERT error detector input and the oscilloscope channel 1 via 2.92 mm K-type tables and a power splitter. An error-free reference signal is connected between the BERT D2 output to the oscilloscope channel 2, along with the error trigger signal from the error detector output to the oscilloscope channel 3. An oscilloscope Edge trigger is set on the rising edge of the error detector output signal on C3.

Configuring Dynamic Oscilloscope Measurements Using Advanced Customization

Figure 1. The Advanced Customization option
lets you seamlessly and continuously update the
input of one parameter with the output of another.

With the installation of the Advanced Customization (XDEV) option on Teledyne LeCroy MAUI® oscilloscopes, you can create a measurement parameter whose input value is dynamically updated with each new trigger by the output value of another measurement parameter. All that is required is three simple lines of VBScript. 

To demonstrate, we’ll use the example of taking the x@max value measured on each acquisition and using it to dynamically populate the X position used by the measurement parameter lvl@x. However, these principles could be applied to any two parameters that share a logical/mathematical relationship, or to a parameter and a math function (for example, to use the output of a parameter as the multiplier for a Rescale function).

9 Important Things to Know When Making Sensitive Measurements with Oscilloscopes

We've routinely posted on how you can characterize your total measurement system to gain important "situational awareness" when using an oscilloscope to make sensitive measurements. The knowledge gained from these tests helps you properly interpret your measurement results so that you can deduce what is actually going on with your circuit, versus what is an artifact of the measurement system. Listed here are nine important things you should know before making sensitive measurements with your oscilloscope, with links to blog posts that instruct you how to test them.

Transmission Lines for Oscilloscope Users, Part 4

Figure 1: Characteristic waveform when the source
impedance is lower than the cable impedance.

In Part 3, we saw the pattern of reflections that occur when both the source impedance and the oscilloscope input impedance are higher than that of the interconnect, and how those reflections affected the rise time measurement. Now let’s briefly consider what happens when the source impedance is lower than the impedance of the connecting cable. 

For this example, the source voltage is a 3.3 V square wave and the source impedance is 9 Ω. As before, our transmission line is a 50 Ω coaxial cable connecting the source to the oscilloscope. If the oscilloscope input termination is set to 1 MΩ, we see the interesting waveform shown in Figure 1.

Transmission Lines for Oscilloscope Users, Part 3

Figure 1: The Thevenin equivalent circuit model can be used
to characterize a voltage source with respect to the 
interconnect cable and oscilloscope input termination.

In Part 2, we demonstrated how to calculate the instantaneous impedance of a transmission line. However, any measurement made using an oscilloscope should consider not only the transmission line, but the source, the transmission line and the oscilloscope as a system. Therefore, characterizing your source, as well as knowing the effects of your oscilloscope input impedance, is important to developing the “situational awareness” needed to interpret measurements properly.

Two terms needed for us to characterize the source are the Thevenin source voltage and the Thevenin source resistance. Once we know these, we have all the pieces we need to fully understand what is happening with our measurements. This is true whether the signal source is a Cal terminal or a device-under-test.

Transmission Lines for Oscilloscope Users, Part 1

Figure 1: The rise time of the Cal signal seems to
increase significantly by increasing the length of the
interconnect cable. Is it true? Click image for details.

This post is the first of a series that will discuss what every oscilloscope user needs to know about transmission lines. It is going to introduce you to the absolutely most important signal integrity principles everybody needs to know when using an oscilloscope to measure signals with rise times shorter than 10 nanoseconds. After demonstrating some easily misinterpreted measurements, we’re going to look “under the hood” at what’s really happening to show you how it's all about the principles of transmission lines. Awhile back, Dr. Eric Bogatin offered a condensed version of What Every Oscilloscope User Needs to Know About Transmission Lines that summed up the key takeaways, but by revisiting “Transmission Lines 101” with us here, we’ll hopefully also show you a different way of thinking about your measurements.

How to Use Memory Properly

In a recent post, we addressed setting sample rate for serial data acquisition, but let’s look again at how time per division (time/div), memory length and sample rate all interact, and what you can do to optimize your use of oscilloscope capture memory when setting up your timebase.

Figure 1: Sample rate as a function of time/div for three different memory lengths.
Longer memory extends the range of time/div settings that support the highest sample rate.

TDME Primer: Selecting Sample Rate for Serial Bus Analysis

Figure 1. Sample rate of only four sample points per bit
decodes correctly and lengthens serial bus acquisition.

Teledyne LeCroy supports trigger, decode, measure/graph, and eye diagram (TDME) software options for over 20 serial data standards, and the list is growing. This series will address practical tips for using TDME software successfully, and showcase some examples of applying TDME capabilities to real-world problems.

Given the wide range of protocols supported, you might be curious about how to best choose the oscilloscope sampling rate for a given standard when acquiring serial data signals. The optimal sample rate is determined by three principal factors: 

1) the bandwidth of the signal being digitized by the oscilloscope’s analog-to-digital converter (ADC);

2) the desired duration of the acquisition;

3) what you are going to do with the acquisition.

Oscilloscope Basics: Multiplexed Front Panel Controls

Fig. 1. Modern,
slim front panel.

Most Teledyne LeCroy oscilloscopes are equipped with traditional front panel controls—knobs and buttons—that are a (literally) handy way to make basic acquisition settings such as gain, timebase and trigger level. While all these could be made using the oscilloscope software, using the front panel allows you to keep dialogs closed and more of the screen “real estate” available for viewing traces as you modify these settings.

In order to optimize that real estate, front panels have become increasingly slim, and many front panel controls on newer Teledyne  LeCroy oscilloscopes are multiplexed, meaning they have multiple functions or can be used to control multiple on-screen objects. Here is a list of tips to keep in mind when using the front panel.

Using 50-Ohm Coax From DUT to Oscilloscope

Figure 1: A coaxial cable presents high impedance at low
frequencies but acts as a transmission line at higher frequencies

In our recent exploration of 10x passive probes, we've determined that while these types of probes are great general-purpose tools, they're not necessarily going to do the job in specialized measurement circumstances. They're relatively low-bandwidth, low-SNR probes that impose some limitations and, in some scenarios, can deliver potentially misleading or erroneous measurement results if used without clear understanding of their capabilities.

10x Passive Probes and Cable Reflections

Figure 1: With unequal impedances at either end of the coax,
are cable reflections a concern in 10x passive probes?

We've been discussing the ubiquitous 10x passive probe here on Test Happens, beginning with an overview of the probe-oscilloscope system. We turned to the 10x passive probe itself and the issues posed by its constitutive circuitry. Then we covered what about that circuitry makes it usable at all, namely, its built-in equalization circuit.

A Walk-Through of Ground-Bounce Measurements

Figure 1: The trigger pulse from the
MCU is one clock cycle in width

In earlier posts in this series, we've explained what ground bounce is and how it happens. We have also taken a deeper dive into the use of I/O drivers to implement sense lines that let us better quantify and analyze what kind of ground-bounce hit our system is taking. Now, let's look at a detailed example of how to measure and diagnose ground bounce.

Acquiring and Characterizing IoT Sensor Signals

Figure 1: IoT devices use many sensors to collect data
about their ambient environment

If we recall our earlier post with its definition of what constitutes an Internet-of-Things (IoT) device, one of the main functions of such devices is to sense its environment and digitize the collected data. Often, an IoT device uses many sensors to collect information about its environment (Figure 1). Having the ability to capture and analyze signals from numerous sensors simultaneously is critical to ensure proper and optimal functionality of the IoT device's design.

Debugging the IoT

Figure 1: Chances are you're already
using the IoT in various ways

By now, we're all familiar with the phrase "Internet of Things" (IoT); some of you may be directly involved with that concept on some level as a designer/technologist. Here, we'll begin a series of posts on the IoT with some broad discussion of what it's all about, and then segue into how oscilloscopes and related hardware/software are among the best tools available for design and debug of IoT-related devices.

Probing Techniques and Tradeoffs (Part III)

Figure 1: Bandwidth is defined as the frequency at which
the ratio of the displayed amplitude to the input amplitude
is -3 dB (or 0.707)

Any discussion of oscilloscopes and/or probes must include the topic of analog bandwidth. Bandwidth is one of a short list of key specifications for a testbench setup. All oscilloscopes and probes come to market with a bandwidth specification, which is defined as:

The frequency at which the ratio of the displayed amplitude to the input amplitude is -3 dB (or 0.707).

This is known as the "-3 dB point," or the half-power point (Figure 1). At this frequency, a sine-wave input signal is attenuated to 70.7% of its true amplitude. Any higher frequencies will likely be distorted on the display, making accurate measurements and calibration impossible.

Automotive Ethernet Compliance: Tests in Detail (Part IV)

Figure 1: The specified pass/fail mask for the
transmitter power spectral density test

We've been making our way through a detailed accounting of the compliance tests for Automotive Ethernet, and in our last post, we covered the distortion test. Now we'll wrap up the tour of the compliance test suite with the test of transmitter power spectral density.