You need to test, we're here to help.

You need to test, we're here to help.
Showing posts with label CMRR. Show all posts
Showing posts with label CMRR. Show all posts

21 February 2022

9 Important Things to Know When Making Sensitive Measurements with Oscilloscopes

We've routinely posted on how you can characterize your total measurement system to gain important "situational awareness" when using an oscilloscope to make sensitive measurements. The knowledge gained from these tests helps you properly interpret your measurement results so that you can deduce what is actually going on with your circuit, versus what is an artifact of the measurement system. Listed here are nine important things you should know before making sensitive measurements with your oscilloscope, with links to blog posts that instruct you how to test them.

05 April 2021

How to Test the CMRR of Differential Probes

Figure 1: CMRR plots for two attenuation settings of an HVD3106A differential probe.
Figure 1: CMRR plots for two attenuation
settings of an HVD3106A differential probe.
While recently we told you not to connect two probes to the same place at the same time, there is a case where connecting two tips of a differential probe to the same place at the same time is useful, and that is when testing the probe’s common mode rejection ratio (CMRR). CMRR is frequency dependent, so part of developing “situational awareness” of your test environment is to know how your probe behaves with different signals at different frequencies. 

Although CMRR as a function of frequency is a principal specification for differential probes, manufacturer's CMRR plots are the result of testing with a narrowband source under strictly controlled laboratory conditions. In real-world applications of probes to broadband sources, you can expect a different result. This quick test will inform you how different.

22 February 2021

Don't Attach Multiple Probes to the Same Place at the Same Time!

Figure 1. Response of two different probes to an upper-side gate drive measurement.
Figure 1. Response of two different probes to an
upper-side gate drive measurement.
Along with using single-ended passive probes for high-voltage measurements, another probing "no no" to avoid is attaching multiple probes to the same place at the same time.

You are probably aware that all measuring instruments, including oscilloscopes, are subject to conditions of observability.  As we discussed in a recent post on The Impact of the Interconnect, the very act of connecting the oscilloscope to the circuit with a particular probe affects the measurement in a particular way. Probes affect the circuit by applying additional resistance and capacitance loads in parallel with the circuit at the test point. Moreover, the probes themselves limit the fidelity of the measurement due to limits of bandwidth, slew rate and common mode response. So, it is always a good idea when making a measurement to compare how different probes/interconnects will affect the measurement…but don’t try to do it all at once.  

09 June 2015

Testing Techniques For Switch-Mode Power Supplies

A simplified schematic of a switch-mode power supply circuit
Figure 1: A simplified schematic of
a switch-mode power supply circuit
On its journey from wall socket to the device being powered, power typically passes through a switch-mode power supply, where the AC signal is rectified into DC before it reaches the device. After that, the DC signal (often 5 V) is passed on to DC-DC converters on the device's PC board for feeding various voltages to branches of the device's power-delivery network. Let's look at some of the measurement techniques and considerations relative to testing switch-mode power supplies.

12 December 2013

Back to Basics: Probes (Part IV)

An example of differential probes
Figure 1: An example of
differential probes
measuring from test
point to test point.
In three earlier posts on the basics of oscilloscope probes, we've taken a broad overview approach, looked more deeply at passive probes and inductance effects, and most recently, dug into active probes. Next up is differential probes, a different animal entirely from the foregoing types.

23 July 2013

Back to Basics: Differential Probing

Emitter voltage in simplified schematic
Figure 1: Emitter voltage measurement
in simplified schematic view
Whether or not we think of it in such terms, any voltage measurement taken with an oscilloscope or voltmeter is, in reality, a differential voltage measurement. A voltage is, by definition, the difference in electrical potential between two points in a circuit. It's impossible to take a voltage measurement with only one voltmeter lead. One lead must be attached to the point of interest while the other must be connected somewhere else as a reference point.