Choosing a High-voltage Oscilloscope Probe for SiC/GaN Power Semiconductor Device Measurements

Figure 1: Wide-bandgap (GaN) power semiconductor device
waveforms captured using two, different probe topologies.
Click on any image to expand.

In our last post, we introduced you to a new tool on the Teledyne LeCroy website: The High-voltage Probe Selection Guide. To demonstrate the benefits of the guide, let’s explore further what must be considered when choosing an HV oscilloscope probe for power semiconductor device measurements.

Why are power semiconductor device measurements challenging?

How to Choose the Best High-voltage Oscilloscope Probe in 5 Minutes

Figure 1: The High-voltage Probe Selection Guide
color codes better or worse probe selections based on
your answers to three, simple questions.
Click any image to enlarge.

Probing high-voltage (HV) circuits for analysis with an oscilloscope presents unique challenges due to the potential for injury or equipment damage, as well as the demands of the materials used in HV semiconductors. HV floating measurements are extremely dangerous and difficult to make. Conventional passive probes are not the answer, but isolated and high-voltage differential probes are options. Yet, with many possible choices in these categories, how can you decide which is actually the best HV oscilloscope probe for your application?

Teledyne LeCroy offers this new, easy way to help you select a high-voltage oscilloscope probe based on your specific application—the High-voltage Probe Selection Guide—available on the Teledyne LeCroy website at: teledynelecroy.com/powerprobes

10x Passive Probes and Cable Reflections

Figure 1: With unequal impedances at either end of the coax,
are cable reflections a concern in 10x passive probes?

We've been discussing the ubiquitous 10x passive probe here on Test Happens, beginning with an overview of the probe-oscilloscope system. We turned to the 10x passive probe itself and the issues posed by its constitutive circuitry. Then we covered what about that circuitry makes it usable at all, namely, its built-in equalization circuit.

Secrets of the 10x Passive Probe

Figure 1: The 10x passive probe
becomes a better measurement
tool when we understand its
limitations

We began this series of posts on oscilloscope probes by putting them in perspective: Probes have a number of different jobs to do, including serving effectively as both a mechanical and electrical interface. Despite having electrical attributes of their own, we want them to grab our signal of interest, but we don't want them to affect that signal in any way.

Probing Techniques and Tradeoffs (Part VIII): Gain/Attenuation vs. Noise

Figure 1: Noise comparison of a
Teledyne LeCroy D1605 probe and
a competing model

When discussing oscilloscope probes and dynamic range as we've been doing of late, we must also touch upon the associated topics of internal gain/attenuation and how that relates to noise.

Probing Techniques and Tradeoffs (Part VI): Dynamic Range

Figure 1: Differential-mode dynamic range is the maximum
allowable voltage between the probe amplifier's inputs

We've been discussing probe loading, which is the unavoidable reality of what happens when you attach an oscilloscope probe to a live circuit. We'll now shift the discussion to dynamic range, an important topic that can be overlooked when selecting an oscilloscope probe. There are three types of dynamic range that one should understand. Each of them will influence how you set up your probe and how you set up your signal under test to most effectively get that signal into the oscilloscope's front-end amplifier.

Probing Techniques and Tradeoffs (Part V): Probe Loading

Figure 1: A probe's impedance varies
with frequency

Earlier in this series of posts, we alluded to the topic of probe loading, which is an outcome of the fact that to make a measurement, an oscilloscope probe must "steal" some energy from the circuit or device under test. Thus, the probe's tip must have a finite impedance across the frequency range of interest.

Probing Techniques and Tradeoffs (Part I)

Figure 1: Probes are the signal's gateway to the oscilloscope

As any oscilloscope user (hopefully) knows, probing is perhaps the most critical element of getting good measurement results (Figure 1). We must understand our probes' specifications to ensure that we obtain the best possible signal fidelity, and thereby accurately characterize our signal under test. In this series of posts, we'll take you through probing tradeoffs and techniques and help you choose the right probe for the task at hand.