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| Figure 1. Four power rail signals on a single grid, with cursors measuring the time delay between the first pair in the sequence. |
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20 September 2021
Testing Power Rail Sequences in Complex Embedded Systems
13 September 2021
Correlating Sensor and Serial Data in Complex Embedded Systems
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| Figure 1: Voltage output of a temperature sensor. As the temperature rises, the output voltage falls. |
Where it is possible to probe the temperature sensor, the output is a DC signal that changes very slowly over time. Figure 1 shows a direct measurement of the temperature sensor using a heavily filtered oscilloscope channel to minimize noise pickup.
07 September 2021
Correlating Low to High-Speed Events in Complex Embedded Systems
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| Figure 1: A challenge when testing embedded systems is to correlate events in a low-speed interface like SPI to events in a high-speed interface like PCIe. |
Take for example testing the initialization of the system. When power is first turned on, the ROM bios and flash memory initialize program elements that are required by the embedded system’s microprocessor. Once the initialization is complete, the microprocessor has to notify the motherboard via PCIe that it is active and ready to receive data via the high-speed serial bus. This all has to happen within 200 milliseconds.
30 August 2021
Debugging Complex Embedded Systems
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| Figure 1: A typical embedded system has many devices utilizing a wide range of signal types and bandwidths. |
Let's start by defining what we mean by embedded system and deeply embedded system. For our purposes, an embedded system is a fixed function, self-contained control system on one printed circuit board. Typically, printed circuit boards (PCBs) will have multiple passive devices, a few active electronic devices, analog devices, digital devices and a few serial data devices. There tends to be a microcontroller device to process data and control other components. There will also be some type of system memory, often embedded inside the microcontroller. And, there will be some power conversion devices and power distribution elements that power all the other devices in your embedded system.
04 April 2018
Debugging the IoT
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| Figure 1: Chances are you're already using the IoT in various ways |
03 September 2015
Shaking Bugs Out of SPI Buses
| Figure 1: Debugging of SPI on a Teledyne LeCroy WaveSurfer 3000 oscilloscope |
22 July 2015
Debugging I2C Buses in Embedded Systems
| Figure 1: Debugging of I2C on a Teledyne LeCroy WaveSurfer 3000 oscilloscope |
16 April 2014
Is Your Testbench Mixed-Signal Ready?
| Figure 1: A representative block diagram of a mixed-signal embedded system |




