Configuring Dynamic Oscilloscope Measurements Using Advanced Customization

Figure 1. The Advanced Customization option
lets you seamlessly and continuously update the
input of one parameter with the output of another.

With the installation of the Advanced Customization (XDEV) option on Teledyne LeCroy MAUI® oscilloscopes, you can create a measurement parameter whose input value is dynamically updated with each new trigger by the output value of another measurement parameter. All that is required is three simple lines of VBScript. 

To demonstrate, we’ll use the example of taking the x@max value measured on each acquisition and using it to dynamically populate the X position used by the measurement parameter lvl@x. However, these principles could be applied to any two parameters that share a logical/mathematical relationship, or to a parameter and a math function (for example, to use the output of a parameter as the multiplier for a Rescale function).

Getting The Most Out Of Your Oscilloscope: WaveScan and XDEV Custom Parameters

Figure 1: Using WaveScan to search
for rare glitch events

In earlier posts about how to maximize your oscilloscope's utility, we've discussed how to properly capture a waveform, making measurements, and extracting more meaningful information from those measurements that might be readily apparent. Now we'll look at how to correlate anomalous behavior from a waveform with other waveforms we may have captured.