Signal and Power Integrity Tutorial: Power Rail Probing for Rail Compression

Figure 3. Equivalent circuit of a typical CMOS I/O
showing the connection from the on-die rails
and the board-level test points.

By Prof. Eric Bogatin,
Teledyne LeCroy Fellow

Excerpted by permission from the Signal Integrity Journal article, Measuring Only Board-level Power Rail Noise May Be Misleading

Continued from Part 1.

Measuring Rail Compression on the Die

In most applications, we do not have access to the bare die when the chip is assembled on the circuit board. If the IC package has not been instrumented with special pass-through features connecting the rails on the die to board pins, we have to rely on a special trick. [The use of a quiet HIGH and quiet LOW]

When the I/Os of a chip all share the same power and ground rails, which is often the case in small microcontroller devices, designated I/Os can be used as sense lines to measure externally the power rails on the die.

Your Ground Bounce Questions Answered

Figure 1. Line set to "quiet low" shows ground
bounce occurring as I/O driver switches.

During an October 2020 webinar, Don’t Let Ground Bounce RuinYour Day, Dr. Eric Bogatin was asked several questions regarding his topic of presentation. Here are his answers.

Q: From what frequency should we consider ground bounce to be a problem?

A: Ground bounce is really due to a dI/dt. Generally, it becomes a problem with rise times shorter than 100 ns. The bandwidth of this is about 3.5 MHz. This means ground bounce can be an issue at relatively low frequency.

The Causes of Ground Bounce and How To Avoid It

Figure 1: This cross section of a 100-MHz microstrip
transmission line shows us how a return path should look

We've been discussing the topic of ground bounce on digital I/O lines as well as an effective way to diagnose and analyze it. We've also run through a detailed example of how to measure it using a quiet-low I/O driver as a sense line. Now, let's take a step back and examine the root causes of ground bounce, and also discuss some best design practices for avoiding it altogether.

A Walk-Through of Ground-Bounce Measurements

Figure 1: The trigger pulse from the
MCU is one clock cycle in width

In earlier posts in this series, we've explained what ground bounce is and how it happens. We have also taken a deeper dive into the use of I/O drivers to implement sense lines that let us better quantify and analyze what kind of ground-bounce hit our system is taking. Now, let's look at a detailed example of how to measure and diagnose ground bounce.

More on Quiet-Low I/O Drivers and Ground Bounce

Figure 1: To configure an I/O driver as a quiet-low line, its
output is connected directly to Vss on the die

Ground bounce can plague digital I/O lines with bit errors and turn your hair grey trying to uncover the cause in the process. But there is a trick you can use to make the analysis a little easier: using a quiet-low I/O driver as a sense line to reveal the existence, and magnitude, of ground bounce in your system.

About Ground Bounce and How to Measure It

Figure 1: Shown are five I/O drivers
within a package driving signal
lines on a PC board

Designing and/or troubleshooting a system with, say, an MCU driving signals across transmission lines, can be an interesting exercise in patience and diligent sleuthing. Perhaps you're seeing an inordinate amount of bit errors at the receive end of I/O lines but having some difficulty nailing down the source. In many cases, the problem is ground bounce, an issue that can be tough to diagnose and cure. Let's begin an examination of the ground-bounce phenomenon by explaining how it arises and then outlining an approach for finding it.

The Power Integrity Measurement Mindset

Figure 1:  The holistic view
of power integrity

In kicking off a series of posts on power integrity measurements, it might be helpful to start with some thoughts on the mindset, or approach, that one should take in the endeavor. Power integrity is best approached holistically, with an eye toward each of the paths energy may take throughout a system.