Oscilloscope Serial Data Measurements and DAC: Trigger, Decode, Measure/Graph and Eye Diagram Software

Figure 1. Serial bus measurements made available
with "TDME" and "TDMP "decoder options.

All Teledyne LeCroy oscilloscopes support a rich set of standard waveform measurement parameters, but the installation of any "TDME" or "TDMP" serial decoder software option adds special parameters designed for measuring serial data buses. Besides automating the measurement of serial bus timing, these parameters allow you to access encoded serial data and extract it to analog values for what is essentially a Digital-to-Analog Converter (DAC)!

What’s in a Name?

Teledyne LeCroy has adopted the convention of using a key in the name of our serial trigger and decode products that tells you what capabilities they offer.  The “ME” or “MP” in the name of a Teledyne LeCroy serial decoder option (e.g., CAN FDbus TDME or USB4-SB TDMP) refers to "Measure/Graph and Eye Diagram" or "Measure/Graph and Physical Layer Tests." All these options include the following 10 serial bus measurements. Physical Layer Test options will also include measurements designed specifically to meet the requirements of the standard.

Setting Up Your Oscilloscope for EFT Testing

Figure 1: The typical EFT test signal consists of
multiple exponential pulses arranged as pulse bursts.

A third type of electromagnetic compatibility (EMC) testing deals with how devices respond to electrical fast transients (EFT). EFTs are a series of fast, high frequency pulses, often occurring in bursts. These transient events are the result of electrical arcing. EFT pulse bursts occur when a power connection is made or broken, equipment is powered down or circuit breakers are switched. They also occur when inductive loads such as relays, switch contactors or heavy-duty motors produce bursts of narrow high-frequency transients on the power distribution system when de-energized.

The typical compound waveform used for EFT testing is shown in Figure 1.

Figure 2: Acquisition of two EFT bursts at
1.25 GS/s, zoomed to show several timing epochs.

The pulse waveform for EFT testing is defined by a risetime of 5 ns and a pulse width of 50 ns. These pulses are combined into bursts of 5 to 50 pulses spaced at from 10 to 100 µs (10 to 100 kHz). The bursts are typically spaced as much as 300 ms apart. Figure 2 shows an EFT test signal, with two EFT bursts captured by an oscilloscope on channel 2 sampled at 1.25 GS/s.

The two EFT pulse burst are shown in the upper left-hand trace (the two pink blocks). A series of zoom-on-zoom traces are opened to show several timing epochs. Trace Z2 (second from top left) shows a single burst. The zooms keep expanding the horizontal scale until finally at Z8 (bottom right) we see a single EFT pulse.

Following are six, important things to do to make sure you get the best EFT test measurements from your oscilloscope.

Setting Up Your Oscilloscope for Surge Testing

Figure 1: A typical EMC surge test waveform with
1.2 µs rise time and 50 µs half amplitude time.
Zoom trace Z1 shows the details of the rise time.
Click any image to expand it.

Electrical surges result from phenomena like lightning strikes and switching transients.  Electronic devices are subjected to simulated surges to confirm that they continue to operate properly following a surge, just as they are tested against electrostatic discharge. 

Surge pulses are similar to ESD pulses in that they have a very fast rise time, but the fall time is much, much slower. Figure 1 shows a typical surge pulse waveform. Surge testing involves similar measurements to those made for  ESD pulse testing—such as rise time, pulse width and max—but surge testing also requires some additional measurements, such as area under the pulse curve and transmitted charge. 

Figure 2: To verify the surge generator waveform, the
oscilloscope is connected to the generator through an attenuator.

As with ESD pulse tests, oscilloscopes are primarily used to “test the tester,” confirming the output of the surge generator. So, before a surge generator is hooked up to the device under test, it's required to hook it up to an oscilloscope and conduct a series of measurements to make sure the surge pulse is within specification. Figure 2 shows a typical surge test setup.

Following are three, important things to do to make sure you get the best surge measurements from your oscilloscope.

Setting Up Your Oscilloscope for ESD Pulse Testing

Figure 1: An ESD calibration test setup. 
The ESD gun discharges its waveform
into a properly attenuated current target. 

Electrostatic discharge (ESD) pulse tests are a type of conducted immunity testing done to confirm that a device can withstand a sudden transient electrostatic discharge. It is done by using an ESD gun to shoot a pulse of the required voltage at a device while testing that the DUT continues to operate properly. The ESD pulse shape simulates a person, carrying a static charge, touching a device. When their fingertip first touches the device, there is a leading edge with a high peak and fast decay, often visible in the real world as a spark flying from the fingertip. This is followed by a second edge due to the charge in the rest of the human body that propagates toward the fingertip with a time delay.

Oscilloscopes are most often used to “test the tester” in ESD pulse test setups, confirming that the pulse from the ESD gun is the right shape and meets the requirements of the standard to which the device is being tested. A typical calibration test setup is shown in Figure 1. The pulse from the ESD gun is fired directly into a current shunt target connected to the oscilloscope through an attenuator required to keep the signal within the limits of the oscilloscope’s 50 Ω input, which is used for this testing. Then, key parameters of the ESD pulse are measured per one of several standards, such as IEC 61000-4-2.  

ESD standards require a range of measurements. The most common are the initial edge 10% to 90% rise time, peak amplitude, pulse width, amplitude and current levels at specified times from the initial edge (e.g., T1 and T2), and time to half value. 

Following are four, important things to do to make sure you get the best ESD pulse measurements from your oscilloscope.

Oscilloscope Basics: When to Use Trend to Graph Oscilloscope Measurements

Figure 1: Applying the Trend operator to the
same input waveform illustrates how the
Trend is asynchronous to the input waveform.  

In a previous post, we described the characteristics of the Track math function and two key applications of using Tracks to graph oscilloscope measurement data: anomaly detection and waveform demodulation. In this post, we'll discuss the characteristics and uses of the Trend function.

To illustrate an important distinction between Tracks and Trends, the Trend math operator in Figure 1 is now applied to the same signal as was the Track in our previous post without first reacquiring the input waveform. 

Note that unlike a Track, the Trend is not time-synchronized to the input waveform. Only the order of events, and not the timing of events, is retained. The underlying shape of the Track may be displayed in the Trend because the same measurement values from a single acquisition are displayed in the same sequence—however, the timing information of when each of the values has occurred is not retained in the Trend. Therefore, unlike the Track, the Trend does not point to the location of an anomaly. Without time scaling, the Trend does not have the frequency information needed to demodulate an input waveform.

Oscilloscope Basics: When to Use Track to Graph Oscilloscope Measurements

Figure 1: Pulse Width Modulated waveform (yellow)
and Track math operator (blue),
where the X-axis scaling is identical for both.

Modern oscilloscopes contain many tools that can be used for analyzing data, including Track and Trend math functions. Both Tracks and Trends graphically display measurement results and locate anomalies. The main similarity between Tracks and Trends is that the Y-axis of both operators is the measurement parameter itself (for example, Pulse Width, Duty Cycle, Rise Time, Slew Rate, etc.). The main difference between the two math operators is their X-axis, in which the Track uses the identical X-axis and synchronous horizontal scaling as the input waveform, whereas the Trend uses units of chronology. A Track, in essence, is a waveform of the measurement values. A Trend is a data logger showing the history of change in measured parameter values, but points are not necessarily synchronous with the measured waveform.

Use Tracks for Anomaly Detection

The Track provides valuable debugging information by directly pointing to an area of interest. 

Notice the negative-going spike in the Track waveform in Figure 1. Figure 1 occurs at the point in time where the input waveform reaches its most narrow pulse width, and the Track instantly finds it, indicating when one measurement deviates from the others in the graph. The Track identifies the exact location in time where the narrowest or widest pulse width has occurred, and fully describes the measurement changes occurring throughout the entire waveform. Since oscilloscopes can acquire thousands or even millions of waveform edges within a single acquisition, the Track allows an engineer to quickly "find the needle in a haystack".

Configuring Dynamic Oscilloscope Measurements Using Advanced Customization

Figure 1. The Advanced Customization option
lets you seamlessly and continuously update the
input of one parameter with the output of another.

With the installation of the Advanced Customization (XDEV) option on Teledyne LeCroy MAUI® oscilloscopes, you can create a measurement parameter whose input value is dynamically updated with each new trigger by the output value of another measurement parameter. All that is required is three simple lines of VBScript. 

To demonstrate, we’ll use the example of taking the x@max value measured on each acquisition and using it to dynamically populate the X position used by the measurement parameter lvl@x. However, these principles could be applied to any two parameters that share a logical/mathematical relationship, or to a parameter and a math function (for example, to use the output of a parameter as the multiplier for a Rescale function).

Testing Power Rail Sequences in Complex Embedded Systems

Figure 1. Four power rail signals on a single grid, with cursors
measuring the time delay between the first pair in the sequence.

Embedded computing systems generally require multiple supply voltages to deliver power to the microprocessor, memory and other on-board devices. There is usually a 12- or 15-volt DC primary supply, and numerous buck or boost converters working off the primary to help provide various voltages throughout the embedded system. Most microcontrollers have a prescribed order in which the voltages must be applied to prevent problems like lockups, so an area of concern when designing deeply embedded systems is the proper sequencing of power rails as they power up or down. Power management IC’s (PMIC) or power sequencers perform many of the sequencing tasks, but during validation and when troubleshooting, the order and timing of the power sequence should be verified.

How to Use Measurement Statistics to Set Up Triggers

Figure 1.  Histogram of the different pulse widths occurring
in a pulse-width modulated rectangular pulse train.

Triggering is an essential element in all modern digital oscilloscopes.  The trigger synchronizes the oscilloscope’s data acquisition with a user-specified event on the signal, be that an edge, threshold crossing or a specific signal characteristic. Teledyne LeCroy Smart Triggers can trigger oscilloscope acquisitions based on properties such as a period, width, low signal amplitude, slew rate or signal loss. These trigger types are ideal for capturing transient events like glitches, but they require knowing at least a range of possible values for the trigger to detect.

Intermittent transient events and glitches are among the most frustrating problems to detect and solve. This is especially true if you have no idea about the nature of the transient. However, you can use the oscilloscope’s measurement tools to help locate these bothersome transients, then use that information to set up your trigger to capture them when they occur. Here’s how.

How to "Layer" Measurement Tools

Figure 1: Multi-grid display "layers" multiple
measurement tools to find hidden glitch.

Teledyne LeCroy oscilloscopes have four, distinct sets of measurement tools, including measurement graticules, cursors, parameters and graphs. These tools developed historically and are designed to be “layered” on multi-grid MAUI® oscilloscopes so that each addition brings a new level of understanding and insight. Even on oscilloscopes that do not have multi-grid displays, as shown here, several measurement tools can be applied at once for added insight. Read on to see how, properly combined, they can help you find waveform anomalies and assess their frequency of occurrence in a few, simple steps.

Getting The Most Out Of Your Oscilloscope: Math Functions

Figure 1: Parameter math functions
provide a way to create custom
parameters

Parameter math functions are an important part of an oscilloscope's analysis capabilities. Using parameter math, you can create custom parameters based on simple arithmetic relationships between existing parameters. It allows you to add, subtract, multiply, divide, or rescale parameters (Figure 1).

Getting The Most Out Of Your Oscilloscope: WaveScan and XDEV Custom Parameters

Figure 1: Using WaveScan to search
for rare glitch events

In earlier posts about how to maximize your oscilloscope's utility, we've discussed how to properly capture a waveform, making measurements, and extracting more meaningful information from those measurements that might be readily apparent. Now we'll look at how to correlate anomalous behavior from a waveform with other waveforms we may have captured.

Getting The Most Out Of Your Oscilloscope: Tracks and Trends

Figure 1: The track math function
shows how data changes over time

Our discussion of cursors and parameters leads us neatly into the topics of tracks and trends, which are both means of extending parameter measurement into a more analytical direction. We can do this using math functions that are part of your Teledyne LeCroy oscilloscope's toolset.

Getting The Most Out Of Your Oscilloscope: Cursors and Parameters

Figure 1: Cursors (top) and parameter
measurements (bottom) are both
powerful tools in their own right

Oscilloscopes give us a wealth of tools with which to view, measure, and analyze the performance of a circuit. Broadly speaking, two classes of such tools are cursors and parameter measurements. Taken on their own, both classes afford the user a great deal of capability. Put them together, though, and you can really start to gain deep insights into what's going on with a waveform.