You need to test, we're here to help.

You need to test, we're here to help.
Showing posts with label double data rate. Show all posts
Showing posts with label double data rate. Show all posts

18 May 2018

Examples of IoT DDR Debug Scenarios

Using the oscilloscope's Track math function can help pin down timing anomalies
Figure 1: Using the oscilloscope's Track
math function can help pin down
timing anomalies
Our last post considered some broad aspects of debugging DDR memory on Internet of Things (IoT) devices, such as how chip interposers can help with probing access and the benefits of virtual probing software. Let's now take a look at some particular examples of problems with these memory chips and their controllers and see how debugging with an oscilloscope might be approached.

15 May 2018

Debugging DDR Memory on IoT Devices

Embedded systems such as IoT devices often require chip interposers to gain access to signal lines on DDR memory
Figure 1: Embedded systems such as IoT devices often require
chip interposers to gain access to signal lines on DDR memory
Internet of Things (IoT) devices are, at heart, just another embedded computing system, albeit one with an extremely well-defined function. As such, there's bound to be some amount of on-board data storage, and the storage medium of choice these days is typically double data-rate (DDR) memory. DDR memory transfers serial data on both the rising and falling edges of the clock signal, which is the characteristic from which it derives its name.

19 May 2017

Testing the DDR Memory Interface's Physical Layer (Part IV)

Probes are a key element of the total signal acquisition system
Figure 1: Probes are a key element of the total signal
acquisition system
In this multipart survey of testing the DDR interface's physical layer, we've looked at the basics of the interface itself, a high-level overview of the testing, how to access DDR signals, and read/write burst separation. In this installment, we'll cover preparation for the actual testing.

11 April 2017

Testing the DDR Memory Interface's Physical Layer (Part II)

A typical BGA package for DDR memory
Figure 1: Shown is a typical BGA
package for DDR memory
In the first of this series of posts, we undertook a high-level view of physical test of a DDR memory interface. Moving forward, let's look into some of the specific challenges one faces in a close examination of these interfaces.

05 April 2017

Testing the DDR Memory Interface's Physical Layer (Part I)

Clock, strobe, and data are three critical signals in DDR test
Figure 1: Clock, strobe, and data are
three critical signals in DDR test
In an earlier post, we took a brief tour through what constitutes a DDR memory interface: clock, command, address, and strobe+data lines linking a memory controller and an array of DRAM memory ICs. Next, we'll examine what DDR interface testing is all about, concentrating primarily on the physical layer.

29 March 2017

Fundamentals of the DDR Memory Interface

A representative test setup for physical-layer DDR testing
Figure 1: A representative test setup
for physical-layer DDR testing
Double data-rate (DDR) memory has ruled the roost as the main system memory in PCs for a long time. Of late, it's seeing more usage in embedded systems as well. Let's look at the fundamentals of a DDR interface and then move into physical-layer testing (Figure 1).