Testing the DDR Memory Interface's Physical Layer (Part IV)

Figure 1: Probes are a key element of the total signal
acquisition system

In this multipart survey of testing the DDR interface's physical layer, we've looked at the basics of the interface itself, a high-level overview of the testing, how to access DDR signals, and read/write burst separation. In this installment, we'll cover preparation for the actual testing.

Reducing Errors in Switch-Mode Power Supply Measurements

Figure 1: Skew between voltage and current probes

results in power measurement errors

Almost all portable electronic devices, and lots of non-portables, come with switch-mode power supplies. These range from common "wall warts" to the larger brick-sized supplies that power a laptop. We've taken a look at the typical measurements one might make on a switching power supply and at why single-ended measurement techniques should take a back seat to differential approaches. Now, let's see what steps we can take to ensure that our measurements on power supplies are accurate.

Understanding Probe Calibration Methods (Part II)

Figure 1: Experimental setup for comparing a
source-referred signal to an unloaded signal

As many engineers and techs know, there's ample room for confusion when it comes to a proper understanding of oscilloscope probe loading. In an earlier post, we covered probe calibration methods and tried to sort out terms such as calibration, correction, compensation, and de-embedding.