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Figure 1: Wide-bandgap (GaN) power semiconductor device waveforms captured using two, different probe topologies. Click on any image to expand. |
Why are power semiconductor device measurements challenging?
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Figure 1: Wide-bandgap (GaN) power semiconductor device waveforms captured using two, different probe topologies. Click on any image to expand. |
Why are power semiconductor device measurements challenging?
Figure 1: Setup for analysis of switching losses
in a switch-mode power supply's MOSFET
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Figure 1: Skew between voltage and current probes
results in power measurement errors
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Figure 1: A simplified schematic of a switch-mode power supply circuit |