Four Measurement Best Practices

To start the New Year right, we’re going to talk about four measurement "best practices", which will help you get the most out of any oscilloscope you have. These are important when doing any type of measurement—and you can get a good start on them simply by asking yourself the four questions in the sidebar.

1. Anticipate the results

Those who are familiar with Dr. Eric Bogatin’s Rule #9 will know this one. Before you do any measurement, anticipate what you expect the result to be, because that is the most important way of identifying if there is a potential problem. 

Probing Techniques and Tradeoffs (Part X): More Best Practices

Figure 1: Chip clips;
they're not just for
snacks anymore

In probing circuits, as with most endeavors, there are some best practices you can use to enhance your chances of obtaining optimal measurements. We began exploring this concept in our last post, and we'll continue here with more best practices.

Probing Techniques and Tradeoffs (Part IX): Best Practices

Figure 1: The typical manner
of using a hands-free probe
holder can cause issues

Having covered many of the theoretical aspects of probing signals, it's now useful to cover some best practices for high-speed active probing. We'll use some examples involving probing of DDR memory to illustrate what works best and what might not be a good idea from a practical standpoint.

DDR Memory Testing Part III: What Not to Do

Figure 1: Damping resistors on
solder-in probe tips

Testing of dual data-rate memory (DDR) devices and/or modules calls for careful application of some best practices for probing. There will also be cases where the use of chip interposers is called for. Heeding the advice provided in earlier Test Happens posts on this topic will go a long way toward successful probing and testing.

DDR Memory Testing Part II: Using Interposers

Figure 1: The anatomy of a chip interposer

If you're a PCB layout designer, you've probably heard one or more test engineers complain: "Why can't you lay out the board so that it can be tested?" All too often, components that need to be accessible to oscilloscope probes are physically inaccessible, whether it's because of close proximity of adjacent components or ball grid array (BGA) mounting of the DUT. It's nearly always a necessary evil, though, because of PCB cost and/or mechanical constraints.

Eliminate Pitfalls of DDR Memory Testing

Figure 1: DDR test configuration
for a desktop computer

Since its inception as a standard in the mid 1990s, dual data-rate (DDR) SDRAM memory has been near ubiquitous in computing applications. Compared to single data-rate SDRAM, the DDR SDRAM interface makes higher transfer rates possible by more strict control of the timing of the electrical data and clock signals.