9 Quick Fixes to Improve DDR Probing

Figure 1: Reversed Handsfree mounts and chip
clips help relieve strain on fragile solders.

Probing at DRAM pins as required by JEDEC can be challenging. Here are nine, simple ways to improve your DDR probing.

1. Use positioning tools to relieve strain on probe tips

The Handsfree probe holder included as an accessory with several Teledyne LeCroy probes, such as the WaveLink and DH Series probes, was originally designed to put weight on the probe tip to ensure a good contact. However, many DDR probing applications utilize solder-in (SI) tips, where the greater concern is to relieve strain on the tip so as to not disrupt the solder. It turns out that if you use the Handsfree in a “reverse mounted” orientation (Figure 1), it puts the amplifier in a perfect position to help relieve strain on probe tips.

Back to Basics: Differential Probing

Figure 1: Emitter voltage measurement
in simplified schematic view

Whether or not we think of it in such terms, any voltage measurement taken with an oscilloscope or voltmeter is, in reality, a differential voltage measurement. A voltage is, by definition, the difference in electrical potential between two points in a circuit. It's impossible to take a voltage measurement with only one voltmeter lead. One lead must be attached to the point of interest while the other must be connected somewhere else as a reference point.