Back to Basics: Jitter

Figure 1: Jitter is short-term variation
of a signal with respect to its
ideal position in time

Anyone working in applications that involve digital data, clocks, and serial data in general will eventually bump up against issues concerning jitter. Jitter is a subject of keen interest to every strata of the electronics industry. Chip makers, board integrators, system integrators, you name it: Everybody wants, and needs, to come to terms with jitter. It impacts reliability, manufacturability, and cost at all levels. And, of course, it's of keen interest to purveyors of test instruments, including us here at Teledyne LeCroy. In this first post of a projected series on jitter, we'll look at some of the tools built into modern digital oscilloscopes for jitter measurement and analysis.

Oscilloscope Basics: Trigger Holdoff

As discussed in an earlier post, triggering is the means by which we can coax an oscilloscope into showing us what we're looking for in an input signal, and indeed even simply to display it in a stable fashion. Two of the most basic triggering types are edge triggers and pattern triggers. The latter applies to mixed-signal instruments, allowing users to trigger on a logical combination of analog and digital inputs.

Back to Basics: Probes (Part IV)

Figure 1: An example of
differential probes
measuring from test
point to test point.

In three earlier posts on the basics of oscilloscope probes, we've taken a broad overview approach, looked more deeply at passive probes and inductance effects, and most recently, dug into active probes. Next up is differential probes, a different animal entirely from the foregoing types.

Back to Basics: Probes (Part III)

Figure 1: Active oscilloscope probes
sport high resistance and low
capacitance at their tips, but
terminate into a scope's 50Ω input.

In the first two installments of this series on probe basics, we examined some broad probe categories (Part I) and some of the issues that come with probe inductance (Part II). In the present installment, we'll delve a bit deeper into the topic of active probes. We'll also discuss when it's best to use passive probes and when to use active types.

Video: Zooming In On Waveforms

Many modern oscilloscopes offer the ability to zoom in on select portions of a waveform trace, allowing users a much more detailed look at whatever anomalies may (or may not) be present. Zooming is a handy feature on any oscilloscope, but it's even handier if you happen to be using a Teledyne LeCroy HDO. These instruments bring 12 bits of vertical resolution to the table for even more detail and cleaner, crisper waveforms than any legacy 8-bit oscilloscope.

So, without further delay, here's a short tutorial video on how to implement zoom traces on an HDO.

Back to Basics: Probes (Part II)

In a previous post, we provided some basic information about oscilloscope probes, including a brief survey of the different types and what can happen when the probe is connected to a DUT. In this installment, let's continue along those lines and take a closer look at passive probes.

Back to Basics: Probes (Part I)

Figure 1: An example of an active

oscilloscope probe 

To speak of an oscilloscope probe is to open a fairly large can of worms. There are many kinds of probes on the market, with differing functions and characteristics (Figure 1). This is the first in a short series of posts on the basics on probes, what the various kinds are used for, and how they might be expected to affect measurements taken with them.