Test Challenges for PAM4 Signals

The major test challenges posed by PAM4 signals

PAM4 encoding offers the advantage of doubling the bit rate in a serial data channel, doing so by increasing the number of voltage levels from two to four. It's a fairly complex modulation scheme, so it should be no surprise that it presents some test and measurement challenges.

The Fundamentals of PAM4

PAM4 doubles the number of bits in serial data transmissions
by increasing the number of levels of pulse-amplitude modulation,
but does so at the cost of noise susceptibility

As our society's hunger for data grows—not only more data, but more data delivered faster—older modulation schemes based on NRZ-type encoding grow increasingly inadequate. We need to get data from point A to point B as efficiently as possible, whether that means between chips on a PC board or from one end of a long-haul optical fiber to the other. A modulation scheme that's gaining favor in many quarters is PAM4, and in this post we'll look at the basics of PAM4 before turning to the test and analysis challenges it poses.