Test Happens - Teledyne LeCroy Blog

Test Happens.

11 September 2015

For UART Debugging, Triggering is Key

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Figure 1: A typical screen capture of UART serial decode/trigger software In our survey of how modern oscilloscopes and trigger/decode...
03 September 2015

Shaking Bugs Out of SPI Buses

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Figure 1:  Debugging of SPI  on a Teledyne LeCroy WaveSurfer 3000 oscilloscope In the first post of this series , we considered some of...
12 August 2015

Test Challenges for PAM4 Signals

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The major test challenges posed by PAM4 signals PAM4 encoding offers the advantage of doubling the bit rate in a serial data channel, do...
06 August 2015

Why High Oscilloscope Sampling Rates Matter

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Figure 1: Here is an example of aliasing that results from sampling a signal at less than the Nyquist rate of 2f max A key to accurate ...
22 July 2015

Debugging I2C Buses in Embedded Systems

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Figure 1: Debugging of I 2 C on a Teledyne LeCroy WaveSurfer 3000 oscilloscope Embedded systems became ubiquitous decades ago and are n...

PAM4 Test Setups Vary With Applications

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Figure 1: A high-level view of PAM4 use cases In an earlier post, we surveyed the basic properties of PAM4 signals. Now, we will examine...
15 July 2015

The Fundamentals of PAM4

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PAM4 doubles the number of bits in serial data transmissions by increasing the number of levels of pulse-amplitude modulation, but does ...
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