More on Quiet-Low I/O Drivers and Ground Bounce

Figure 1: To configure an I/O driver as a quiet-low line, its
output is connected directly to Vss on the die

Ground bounce can plague digital I/O lines with bit errors and turn your hair grey trying to uncover the cause in the process. But there is a trick you can use to make the analysis a little easier: using a quiet-low I/O driver as a sense line to reveal the existence, and magnitude, of ground bounce in your system.

About Ground Bounce and How to Measure It

Figure 1: Shown are five I/O drivers
within a package driving signal
lines on a PC board

Designing and/or troubleshooting a system with, say, an MCU driving signals across transmission lines, can be an interesting exercise in patience and diligent sleuthing. Perhaps you're seeing an inordinate amount of bit errors at the receive end of I/O lines but having some difficulty nailing down the source. In many cases, the problem is ground bounce, an issue that can be tough to diagnose and cure. Let's begin an examination of the ground-bounce phenomenon by explaining how it arises and then outlining an approach for finding it.

Feed-Forward Equalization

Figure 1: FFE creates a number of delayed versions of the
input signal that are then added back to the signal with
proper weights

In addition to continuous time linear equalization (CTLE), another means of improving signal quality at the receiver end of a high-speed serial data link is known as feed-forward equalization (FFE). In terms of implementation, FFE is not unlike the pre-emphasis filtering that is done on the transmitter side. An FFE implementation looks for all intents and purposes like a digital finite impulse response (FIR) filter.

Continuous Time Linear Equalization

Figure 1: A CTLE implementation at the receiver end of a
serial-data channel seeks to boost higher frequencies while
not boosting noise any more than necessary

We've been looking at the broad topic of debugging high-speed serial links, and in that context, we're also touching on ways to improve signal performance on the receiver side. One of those ways is to implement continuous time linear equalization (CTLE).

Serial-Data Channel Emulation and S Parameters

Figure 1: Higher data rates + "same old" channel media
= degraded signal quality at receiver

Serial data rates have risen but propagation media for the channel remain unchanged, and that results in greater attenuation to the frequencies of interest. We could ignore these losses at lower frequencies, but now that rise times are so much faster, that's not an option. Channel effects now intrude into design margins to the point where eyes deteriorate and bit-error rates become unacceptable.

The Effects of De-Emphasis on Eye Diagrams

Figure 1: This eye diagram of a serial-data stream as measured
at the receiver shows the effect a lossy channel has
on signal quality

Having discussed what transmit pre-emphasis is all about and the various ways in which it's implemented, it might be useful at this juncture to look at some examples of its application and the salutary effect it can have on the signal's eye diagram at the receiver end of the channel. Recall that there are two variations on pre-emphasis: de-emphasis and pre-shoot, which use different taps of a three-tap finite impulse response (FIR) filter to emphasize the last bit or the first bit of a bit sequence, respectively.

Introduction to Channel Equalization

Figure 1: Transmit pre-emphasis pre-distorts signals
in anticipation of the channel's effects

A number of factors can cause degradation of performance in a high-speed serial data link. Among them are inter-symbol interference (ISI) jitter, attenuation, reflections due to impedance mismatches, and insertion losses, to name a few. But fear not: There are techniques one may use to compensate for these losses known as equalization. We'll review the basics of channel equalization in today's post.

Rise-Time Degradation and ISI Jitter

Figure 1: Shown are the signals from two extreme bit patterns
overlaid on top of each other with no interconnect in the channel

In discussing inter-symbol interference (ISI), the phenomenon in which information "leaks" from one bit to subsequent bits, we've identified a couple of root causes of ISI jitter. The first is reflection losses caused by impedance discontinuities, while the second is group delay dispersion, a consequence of the differing propagation speeds of different frequencies through a given material. We looked at these forms of distortion in both the time and frequency domains.

Inter-Symbol Interference (or Leaky Bits)

Figure 1: Inter-symbol interference, or ISI jitter, is the result
of information from one bit "leaking" to subsequent bits

In reviewing the subject of debugging high-speed serial links, one important aspect of signal integrity we must touch on is inter-symbol interference (ISI). ISI is the phenomenon in which information from one bit "leaks" to some subsequent number of bits.

How Much Transmission-Line Loss is Too Much?

Figure 1: This plot represents the differential insertion-loss
profile for a 20" FR-4 microstrip trace

One of the fundamental facts of transmission lines is losses. Any effort to debug the performance of a high-speed serial data link begins there. But it begs an equally fundamental question: How much loss in a transmission line is too much? How do we quantify losses, and what is the connection between attenuation at the Nyquist frequency and the eye diagram? Is there a rule of thumb one might apply, some sort of rough estimate of how much loss might be too much for your channel to bear at a given data rate?

A Look at Transmission-Line Losses

Figure 1: Using a 3D
field solver to simulate
a differential trace

In surveying the subject of debugging high-speed serial data links, we've noted that there's no one cause for signal-integrity issues between transmitter and receiver, and there's certainly no one solution. But let's begin with the low-hanging fruit: electrical losses in the transmission line. We've previously done a series of posts on transmission lines (beginning here), but it's worth it to have a quick refresher.

Introduction to Debugging High-Speed Serial Links

Figure 1: These images depict the degradation of serial data
traffic as it makes its way from transmitter to receiver

In recent years, the data rates in serial links have increased exponentially across any number of standard protocols, including PCI Express, USB, and even SATA and SAS. With higher data rates comes more challenges for system designers, validation engineers, and test engineers with respect to signal integrity (SI). Some SI effects are much more prominent at higher data rates than they were for lower-speed versions of the same protocols. In this series of posts, we'll examine these SI effects, look at some methods of improving system performance, and discuss some SI analysis solutions as well as measurement considerations.

Examples of IoT DDR Debug Scenarios

Figure 1: Using the oscilloscope's Track
math function can help pin down
timing anomalies

Our last post considered some broad aspects of debugging DDR memory on Internet of Things (IoT) devices, such as how chip interposers can help with probing access and the benefits of virtual probing software. Let's now take a look at some particular examples of problems with these memory chips and their controllers and see how debugging with an oscilloscope might be approached.

Debugging DDR Memory on IoT Devices

Figure 1: Embedded systems such as IoT devices often require
chip interposers to gain access to signal lines on DDR memory

Internet of Things (IoT) devices are, at heart, just another embedded computing system, albeit one with an extremely well-defined function. As such, there's bound to be some amount of on-board data storage, and the storage medium of choice these days is typically double data-rate (DDR) memory. DDR memory transfers serial data on both the rising and falling edges of the clock signal, which is the characteristic from which it derives its name.

Debugging Ethernet, SATA, and PCIe for IoT Devices

Figure 1: A generic IoT block diagram
shows serial-data links in blue

In our ongoing review of debugging serial-data standards for Internet of Things (IoT) devices, let's now turn to three more popular protocols: Ethernet, SATA, and PCIe. Ethernet is found in computer networking applications, while the Serial Advanced Technology Attachment (SATA) connects host bus adapters to mass-storage devices. The Peripheral Component Interconnect Express (PCI Express or PCIe) handles communication between root complexes (motherboards) and expansion-card interfaces.

Debugging CANbus For IoT Devices

Figure 1: Temperature data from
thermocouples is shown both
encoded and decoded on the
oscilloscope's display

A myriad of serial-data standards come into play when we're discussing Internet of Things (IoT) devices. We've talked about I2C, SPI, and UART in a previous post. Yet another serial-bus standard that comes under the IoT umbrella is the Controller Area Network (or CANbus) standard. CANbus enables microcontrollers and peripheral devices to communicate with each other in applications without an intervening host computer. In the past, it's been typically used in automotive applications, but CANbus has found its way into a wider scope of applications of late.

Debugging Low-Speed Serial Data on IoT Devices

Figure 1: Serial-data links handle traffic between ICs
and peripheral devices in the IoT world

Our last post discussed the difficulties in acquiring the many sensor signals that may be input to a deeply embedded system such as an IoT device as well as a hardware solution to the problem. Another aspect of IoT debugging and validation is the low-speed serial data standards used to facilitate communication between ICs and between controllers and peripheral devices (Figure 1). To that end, let's take a look at three such low-speed standards: I2C, SPI, and UART.

Acquiring and Characterizing IoT Sensor Signals

Figure 1: IoT devices use many sensors to collect data
about their ambient environment

If we recall our earlier post with its definition of what constitutes an Internet-of-Things (IoT) device, one of the main functions of such devices is to sense its environment and digitize the collected data. Often, an IoT device uses many sensors to collect information about its environment (Figure 1). Having the ability to capture and analyze signals from numerous sensors simultaneously is critical to ensure proper and optimal functionality of the IoT device's design.

Investigating IoT Wireless Signals (Part II)

Figure 1: This screen capture depicts frequency demodulation
and subsequent Manchester decoding of the bit stream

Internet of Things (IoT) devices must communicate with their peers--other IoT devices--as well as with the host system that governs their activities. In our previous post, we examined how to perform amplitude and frequency demodulation of RF bursts, such as Bluetooth Low Energy (BLE) advertising bursts. We'll continue with other methods of analyzing RF signals.

Investigating IoT Wireless Signals

Figure 1: Many IoT devices accept
wireless antennas using U.FL
connectors

Many IoT devices use wireless methods to communicate with other devices or with host systems. Just as with DC power-rail signals, probing of RF signals should be done with as little noise and as non-invasively as possible and with the best possible signal fidelity. Effective probing opens the door to Wi-Fi and Bluetooth signal analysis with RF demodulation, vector signal analysis, and spectrum analysis.

IoT Digital Power Management and Power Integrity

Figure 1: The half-bridge output
current from each DC-DC phase
is known as the inductor current

An Internet of Things (IoT) device derives its power either from a 12-V DC supply or from a battery. In either case, power is fed to one or more power rails that operate at different voltages. These rails power the CPU and other functional blocks on the PC board. In this post, we'll take a look at how to examine an IoT's power supply for proper digital power management implementation and for power integrity.

Anatomy of an IoT Device

Figure 1: IoTs include SOCs, DDR,
DPM ICs, wireless, and MCUs

There's already more Internet of Things (IoT) devices deployed than there are humans on Earth. That gap will increase radically in coming years, and the explosion in IoT devices means a commensurate explosion in the need for debugging tools. So what's in an IoT device to debug, anyway?

Debugging the IoT

Figure 1: Chances are you're already
using the IoT in various ways

By now, we're all familiar with the phrase "Internet of Things" (IoT); some of you may be directly involved with that concept on some level as a designer/technologist. Here, we'll begin a series of posts on the IoT with some broad discussion of what it's all about, and then segue into how oscilloscopes and related hardware/software are among the best tools available for design and debug of IoT-related devices.

An Example of Three-Phase Power Measurements

Figure 1: Screen capture of a 10-s acquisition of AC input
and PWM output of a 480-V motor drive

To follow up on our last post on three-phase power calculations, and to wrap up this series of posts on the fundamentals of power, we'll walk through an example of a set of three-phase power measurements. We'll base our discussion on a single screen capture of measurements taken on a 480-V motor drive with 480-V AC input and 480-V maximum drive output. For this example, we used a Teledyne LeCroy Motor Drive Analyzer.

Three-Phase Power Calculations

Figure 1: Three-phase power calculations
entail summing of the individual
phases's power calculations

Until now, our discussions of power calculations have encompassed only single-phase systems with one voltage and one current. Now we'll turn to three-phase systems, which can be thought of as a collection of three single-phase systems. In general, three-phase power calculations are a simple summing of the individual phase power calculations and should be balanced across all three phases.

Power Calculations for Distorted Waveforms

Figure 1: The sum of many sine waves, of varying
amplitudes and frequencies, comprises the rough-
looking square wave shown in red

Our last post covered basic power calculations for pure sine waves, which are useful only up to a point in that pure sine waves are rather rare in the real world. Almost any real-world waveform carries some amount of distortion. Because distorted voltage and current waveforms comprise multiple frequencies, the relatively simple techniques used to measure power for pure, single-frequency sine waves no longer apply.

Power Calculations for Pure Sine Waves

Figure 1: For a purely resistive load,
power = voltage * current, with both vectors in phase

Wouldn't it be wonderful if every sine wave we encountered in the real world was pure, with no distortion? It sure would make life easier. Alas, it's pretty much never the case. But in reviewing sinusoidal power calculations, it's best that we begin with the simplest case: a single, pure sinusoidal line voltage and single, pure sinusoidal line current supplying a linear load.

Back to Basics: AC Sinusoidal Line Current

Figure 1: A single-phase AC current
vector rotates at 50 or 60 Hz

We've reviewed the basics of AC line voltage in previous posts. Now we'll turn our attention to the other fundamental component of line power. Regardless of whether you call it "grid," "household," "line," "utility," or "mains," AC sinusoidal current is what flows from the power utility's lines into every home and business.

More Basics of Three-Phase AC Sinusoidal Voltages

Figure 1: In the Wye three-phase
connection, neutral is present but
sometimes inaccessible

Our last post in this series on the essential principles of power covered the basics of three-phase voltages: their composition of three voltage vectors, how they're generated, how they're measured (line-line or line-neutral), and conversion of line-line values to line-neutral values. Here, we'll pick up the thread with more on three-phase AC voltages.

Transmission Lines (Part V): Reverse-Engineering the DUT

Figure 1: Every DUT can be thought of as a Thevenin
voltage source with some internal resistance

There are always two primary elements of any test and/or measurement application: the oscilloscope and the device under test (DUT). Getting valid measurement results depends, first and foremost, on the oscilloscope's capabilities given the task at hand. It also depends on what we'll call "situational awareness," or the operator's understanding of the oscilloscope and of the characteristics of the DUT.

Transmission Lines (Part IV): More Essential Principles

Figure 1: The return current in a transmission line
is as important as the signal current

In our continuing survey of the topic of transmission lines, we'd begun in our last post to cover some essential principles that govern their behavior. We're not quite done with those, so in this post we'll discuss more principles that should be part of the foundation of how you think about interconnects.

Transmission Lines (Part III): Essential Principles

Figure 1: All interconnects are transmission lines with a signal
path and a return path (not ground)

Now that we've covered some of the principles and assumptions that underlie transmission lines in two prior posts, we can now directly address the topic with some essential principles that you need to understand.

Transmission Lines (Part II): More on Bandwidth vs. Rise Time

Figure 1: In the frequency domain (right), a near-ideal
square wave displays predictable 1/f amplitude dropoff

We began this series about transmission lines by thinking about some pertinent principles and relationships that can help form our thinking about the topic. In particular, we'd covered the relationship between bandwidth and rise time and why we have this rule of thumb that says that bandwidth can be estimated using 0.35/10-90% rise time.

Transmission Lines (Part I): Introduction

Figure 1: All oscilloscopes
have a Cal output like the
one pictured here

Somewhere on the front panel of almost any oscilloscope is a "Cal" reference signal output (Figure 1). That signal is really intended for adjusting the capacitance compensation screw to calibrate a 10X high-impedance probe, but most of us know it simply as the Cal signal. Have you ever noticed that the Cal signal's rise time seems to be highly dependent on the length of the cable attached to it, and maybe even wondered why?

Probing Techniques and Tradeoffs (Part XI): Non-Ideal Situations

Figure 1: VP@Rcvr builds a transmission-line model
to virtually move less-than-ideal probing points

In using an oscilloscope to investigate transmission-line performance, we often encounter situations in which we don't have the luxury of probing at the ideal location. Fortunately, there are software tools that enable us to virtually move our probing point close to the receiver.

Probing Techniques and Tradeoffs (Part X): More Best Practices

Figure 1: Chip clips;
they're not just for
snacks anymore

In probing circuits, as with most endeavors, there are some best practices you can use to enhance your chances of obtaining optimal measurements. We began exploring this concept in our last post, and we'll continue here with more best practices.

Probing Techniques and Tradeoffs (Part IX): Best Practices

Figure 1: The typical manner
of using a hands-free probe
holder can cause issues

Having covered many of the theoretical aspects of probing signals, it's now useful to cover some best practices for high-speed active probing. We'll use some examples involving probing of DDR memory to illustrate what works best and what might not be a good idea from a practical standpoint.

Probing Techniques and Tradeoffs (Part VIII): Gain/Attenuation vs. Noise

Figure 1: Noise comparison of a
Teledyne LeCroy D1605 probe and
a competing model

When discussing oscilloscope probes and dynamic range as we've been doing of late, we must also touch upon the associated topics of internal gain/attenuation and how that relates to noise.

Probing Techniques and Tradeoffs (Part VII): More on Dynamic Range

Figure 1: Input offset range is how much
differential offset a probe can apply to
an input signal to bring it within its
differential-mode output range

In our last post in this series, we'd begun discussing the third of three types of dynamic range as applied to probes, and that is input offset range. This is the maximum differential offset that a probe can apply to the input signal to bring it within the probe's differential-mode dynamic range.

Getting The Most Out Of Your Oscilloscope: Physical-Layer Tools

Figure 1: Trigger dialog boxes will
match the protocol of interest

Debugging and validation of the physical layer of serial-data links is a preeminent oscilloscope application area these days. Today's real-time digital oscilloscopes have a wealth of tools to help you dig into any/all serial protocols and learn what's really going on electrically with your serial links.

Getting The Most Out Of Your Oscilloscope: Math Functions

Figure 1: Parameter math functions
provide a way to create custom
parameters

Parameter math functions are an important part of an oscilloscope's analysis capabilities. Using parameter math, you can create custom parameters based on simple arithmetic relationships between existing parameters. It allows you to add, subtract, multiply, divide, or rescale parameters (Figure 1).

Getting The Most Out Of Your Oscilloscope: Sequence and History Modes

Figure 1: Sequence mode grabs rare triggered events from
long captures and stores them in segments

When using an oscilloscope, there are bound to be instances in which you need to capture a large number of fast pulses in quick succession, or, conversely, a small number of events separated by long periods of time. Both are challenging for typical signal acquisition modes. But many Teledyne LeCroy oscilloscopes provide what's known as Sequence mode, which lets you capture these events while ignoring the long intervals between them.

Getting The Most Out Of Your Oscilloscope: WaveScan and XDEV Custom Parameters

Figure 1: Using WaveScan to search
for rare glitch events

In earlier posts about how to maximize your oscilloscope's utility, we've discussed how to properly capture a waveform, making measurements, and extracting more meaningful information from those measurements that might be readily apparent. Now we'll look at how to correlate anomalous behavior from a waveform with other waveforms we may have captured.

Getting The Most Out Of Your Oscilloscope: Tracks and Trends

Figure 1: The track math function
shows how data changes over time

Our discussion of cursors and parameters leads us neatly into the topics of tracks and trends, which are both means of extending parameter measurement into a more analytical direction. We can do this using math functions that are part of your Teledyne LeCroy oscilloscope's toolset.

Getting The Most Out Of Your Oscilloscope: Cursors and Parameters

Figure 1: Cursors (top) and parameter
measurements (bottom) are both
powerful tools in their own right

Oscilloscopes give us a wealth of tools with which to view, measure, and analyze the performance of a circuit. Broadly speaking, two classes of such tools are cursors and parameter measurements. Taken on their own, both classes afford the user a great deal of capability. Put them together, though, and you can really start to gain deep insights into what's going on with a waveform.

Getting The Most Out Of Your Oscilloscope: Documentation

Figure l: A LabNotebook entry quickly and easily saves
everything you need to later replicate your measurements

If we really want to get the most out of our oscilloscopes, we'd be remiss in overlooking the documentation capabilities that modern instruments provide. It's so important to document our working sessions so they're consistent and repeatable. Oscilloscope setups can be quite intricate for a given measurement or procedure. Why not let the instrument help us keep track of such things?

Getting The Most Out Of Your Oscilloscope: Trigger Delay

Figure 1: Pre-triggering, or trigger delay, is a useful tool for
debugging applications

Triggering is one of the most basic, yet most useful, tools your oscilloscope offers you. Say you want to see what led up to, and/or what follows, a trigger condition. You're looking at an interesting waveform such as that shown in Figure 1. You have the trigger's delay position set at 10% and 90%.

Getting The Most Out Of Your Oscilloscope: Navigation With MAUI

Figure 1: Oscilloscope UIs such as
Teledyne LeCroy's MAUI provide
tons of shortcuts and touch gestures

Today's real-time digital oscilloscopes are easier to use than their predecessors, and new models get easier all the time. Oscilloscopes often are equipped with touch screens and elaborate user interfaces that provide a plethora of shortcuts and smartphone-like touch gestures that make common operations extremely fast and easy.

Getting The Most Out Of Your Oscilloscope: Setup

Figure 1: Choosing a effective sample rate is key
to seeing the finer details of a waveform

Today's real-time digital oscilloscopes are so packed with bells and whistles (or "features," if you prefer) that you can forget how to use many of them. In fact, you might not even realize some exist! But they're all there for a reason, and they're all useful, maybe even more so than you know. To that end, we'll take a tour of a typical Teledyne LeCroy oscilloscope's features and give you some pointers as to how, and when, you can best take advantage of them.

Making On-Die Power-Rail Measurements (Part III)

Figure 1: This screen capture shows
the idle-state conditions

Having reviewed the test setup for on-die power-rail testing and our expectations of what the tests should show us, let's walk through the measurements and look over the results. We'll also note whether our results align with our expectations or are outside of those expectations.